Segment Profile Extraction via Pattern Analysis // Implements the Segment Profile Extraction via Pattern Analysis method for row- mean-centered multivariate data. Core capabilities include SVD- based row-isometric biplot construction, bias-corrected and accelerated, and percentile bootstrap confidence intervals for domain coordinates and per-person direction cosines, Procrustes alignment of bootstrap replicates across planes, parallel analysis for dimensionality selection, and segment profile reconstruction in planes defined by pairs of singular dimensions. A synthetic Woodcock-Johnson IV look-alike dataset is provided for examples and testing. The method is described in Kim and Grochowalski (2019) doi:10.1007/s00357-018-9277-7.